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# Date: 05/10/2024


@Article{khan2008a,
  author = {Khan, A. and Fricke, J. Ch. and Hoeher, P. A.},
  title = {{Throughput improvement by reliability-dependent layer allocation in IDM}},
  journal = {IET Electronics Letters},
  year = 2008,
  volume = {44},
  number = {16},
  pages = {958--960},
  month = jul,
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=4586182&arnumber=4586192},
  issn = {0013-5194}
}